I-substrate ye-SiC eyi-12 intshi Ububanzi obuyi-300mm Ubukhulu obuyi-750μm Uhlobo lwe-4H-N lungenziwa ngokwezifiso
Iiparameter zobugcisa
| Inkcazelo ye-Substrate ye-Silicon Carbide (SiC) ye-intshi ezili-12 | |||||
| Ibanga | Imveliso yeZeroMPD Ibanga (Ibanga le-Z) | Imveliso Esemgangathweni Ibanga (Ibanga le-P) | Ibanga elingeyonyani (Ibanga le-D) | ||
| Ububanzi | 3 0 0 mm~1305mm | ||||
| Ubukhulu | 4H-N | 750μm±15 μm | 750μm±25 μm | ||
| 4H-SI | 750μm±15 μm | 750μm±25 μm | |||
| Uqeqesho lweWafer | I-axis engasebenziyo: 4.0° ukuya kwi-<1120 >±0.5° kwi-4H-N, I-axis engasebenziyo: <0001>±0.5° kwi-4H-SI | ||||
| Uxinano lweeMipayipi ezincinci | 4H-N | ≤0.4cm-2 | ≤4cm-2 | ≤25cm-2 | |
| 4H-SI | ≤5cm-2 | ≤10cm-2 | ≤25cm-2 | ||
| Ukuxhathisa | 4H-N | 0.015~0.024 Ω·cm | 0.015~0.028 Ω·cm | ||
| 4H-SI | ≥1E10 Ω·cm | ≥1E5 Ω·cm | |||
| Uqhelaniso oluPhambili oluSicaba | {10-10} ±5.0° | ||||
| Ubude obuPhambili obuSicaba | 4H-N | N / A | |||
| 4H-SI | I-Notch | ||||
| Ukukhutshwa komda | 3 mm | ||||
| I-LTV/TTV/Isaphetha/I-Warp | ≤5μm/≤15μm/≤35 μm/≤55 μm | ≤5μm/≤15μm/≤35 □ μm/≤55 □ μm | |||
| Uburhabaxa | I-Polish Ra≤1 nm | ||||
| I-CMP Ra≤0.2 nm | I-Ra≤0.5 nm | ||||
| Iimfantu zoMphetho ngokukhanya okuphezulu Iipleyiti zeHex Ngokukhanya Okuphezulu Kobungqingqwa Iindawo zePolytype Ngokukhanya Okuphezulu Izinto ezibandakanyiweyo zeCarbon ezibonakalayo Imikrwelo yomphezulu weSilicone Ngokukhanya Okuphezulu | Akukho nanye Indawo eqokelelweyo ≤0.05% Akukho nanye Indawo eqokelelweyo ≤0.05% Akukho nanye | Ubude obuqokelelweyo ≤ 20 mm, ubude obunye ≤2 mm Indawo eqokelelweyo ≤0.1% Indawo eqokelelweyo≤3% Indawo eqokelelweyo ≤3% Ubude obuqokelelweyo ≤1 × ububanzi besitya esisicaba | |||
| Iitships zomphetho ngokukhanya okuphezulu | Akukho kuvunyelweyo ububanzi nobunzulu obuyi-≥0.2mm | 7 zivunyelwe, ≤1 mm nganye | |||
| (TSD) Ukususwa kwesikrufu sokutsala imisonto | ≤500 cm-2 | N / A | |||
| (BPD) Ukususwa kwesiseko sendiza | ≤1000 cm-2 | N / A | |||
| Ungcoliseko lweSilicon Surface Lubangelwa kukukhanya okuPhakamileyo | Akukho nanye | ||||
| Ukupakisha | Ikhasethi yeewafer ezininzi okanye isitya sewafer esinye | ||||
| Amanqaku: | |||||
| 1 Imida yeziphene isebenza kumphezulu we-wafer yonke ngaphandle kwendawo yokukhupha umphetho. 2 Imikrwelo mayijongwe ebusweni bukaSi kuphela. 3 Idatha yokwahlukana kwesakhiwo ivela kwiiwafers eziqoshiweyo ze-KOH kuphela. | |||||
Ezona mpawu
1. Amandla eMveliso kunye neeNzuzo zeendleko: Ukuveliswa ngobuninzi kwe-substrate ye-SiC eyi-intshi ezili-12 (i-substrate ye-silicon carbide eyi-intshi ezili-12) kuphawula ixesha elitsha kwimveliso ye-semiconductor. Inani leetships ezifumaneka kwi-wafer enye lifikelela ngokuphindwe kayi-2.25 kune-substrates eziyi-intshi ezi-8, nto leyo eqhuba ngokuthe ngqo ukunyuswa kokusebenza kakuhle kwemveliso. Ingxelo yabathengi ibonisa ukuba ukwamkela ii-substrates eziyi-intshi ezili-12 kuye kunciphisa iindleko zabo zemveliso yemodyuli yamandla ngama-28%, kudala ithuba lokhuphiswano oluqinisekileyo kwimarike ekhuphisana kakhulu.
2. Iipropati Ezibalaseleyo Zomzimba: I-substrate ye-SiC eyi-intshi ezili-12 izuza zonke izibonelelo zezinto ze-silicon carbide - ukuhanjiswa kwayo kobushushu kuphindwe kathathu kune-silicon, ngelixa amandla ayo okuqhekeka efikelela kalishumi kune-silicon. Ezi mpawu zivumela izixhobo ezisekelwe kwi-substrates eziyi-intshi ezili-12 ukuba zisebenze ngokuzinzileyo kwiindawo ezinobushushu obuphezulu obungaphezulu kwama-200°C, nto leyo eyenza ukuba zifaneleke ngakumbi kwizicelo ezinzima ezifana nezithuthi zombane.
3. Iteknoloji Yonyango Lomphezulu: Siphuhlise inkqubo entsha yokupolisha ngoomatshini bekhemikhali (CMP) ngokukodwa kwi-substrates ze-SiC eziyi-12-intshi, ukufikelela kwinqanaba le-atomic-level flatness (Ra<0.15nm). Le mpumelelo isombulula umngeni wehlabathi jikelele wonyango lomphezulu we-silicon carbide wafer omkhulu, isusa imiqobo yokukhula kwe-epitaxial esemgangathweni ophezulu.
4. Ukusebenza koLawulo lobushushu: Kwiindlela ezisebenzayo, ii-substrates ze-SiC eziyi-12-intshi zibonisa amandla amangalisayo okusasaza ubushushu. Idatha yovavanyo ibonisa ukuba phantsi kobunzima obufanayo bamandla, izixhobo ezisebenzisa ii-substrates eziyi-12-intshi zisebenza kumaqondo obushushu angama-40-50°C aphantsi kunezixhobo ezisekelwe kwi-silicon, nto leyo eyandisa kakhulu ubomi benkonzo yezixhobo.
Izicelo eziphambili
1. Inkqubo entsha yeZithuthi zamandla: I-substrate ye-SiC eyi-intshi ezili-12 (i-substrate ye-silicon carbide eyi-intshi ezili-12) itshintsha uyilo lwe-powertrain yezithuthi zombane. Ukusuka kwiitshaja ezikwi-onboard (OBC) ukuya kwii-inverters eziphambili kunye neenkqubo zolawulo lwebhetri, uphuculo lokusebenza oluziswa zii-substrate eziyi-intshi ezili-12 lonyusa uluhlu lwezithuthi nge-5-8%. Iingxelo ezivela kumenzi weemoto ophambili zibonisa ukuba ukusebenzisa ii-substrate zethu eziyi-intshi ezili-12 kunciphisa ukulahleka kwamandla kwinkqubo yazo yokutshaja ngokukhawuleza nge-62% emangalisayo.
2. Icandelo laMandla aHlaziyiweyo: Kwizikhululo zamandla ze-photovoltaic, ii-inverters ezisekwe kwi-substrates ze-SiC eziyi-12-intshi azinazo nje kuphela izinto ezincinci kodwa zikwafikelela ekusebenzeni kakuhle kokuguqulwa okungaphezulu kwe-99%. Ingakumbi kwiimeko zokuvelisa ezisasazekileyo, oku kusebenza okuphezulu kuthetha ukonga imali yonyaka yamakhulu amawaka eeyuan kwilahleko zombane kubaqhubi.
3.Ukwenziwa kwezinto ngokuzenzekelayo kwimizi-mveliso: Ii-frequency converters ezisebenzisa ii-substrates ze-12-intshi zibonisa ukusebenza kakuhle kwiirobhothi zoshishino, izixhobo zoomatshini be-CNC, kunye nezinye izixhobo. Iimpawu zazo zokutshintsha ii-frequency eziphezulu ziphucula isantya sokuphendula kwemoto nge-30% ngelixa zinciphisa ukuphazamiseka kwe-electromagnetic ukuya kwisinye kwisithathu sezisombululo eziqhelekileyo.
4. Uphuhliso lwe-Elektroniki zabathengi: Iitekhnoloji zesizukulwana esilandelayo zokutshaja ngokukhawuleza kweefowuni ziqalile ukusebenzisa ii-substrates ze-SiC ze-intshi ezili-12. Kuqikelelwa ukuba iimveliso zokutshaja ngokukhawuleza ezingaphezu kwama-65W ziya kutshintshela ngokupheleleyo kwizisombululo ze-silicon carbide, kunye nee-substrates ze-intshi ezili-12 ezivela njengokhetho olufanelekileyo lweendleko kunye nokusebenza kakuhle.
Iinkonzo ezenzelwe wena ze-XKH ze-12-intshi SiC Substrate
Ukuze kuhlangatyezwane neemfuno ezithile ze-12-intshi SiC substrates (12-intshi silicon carbide substrates), i-XKH inikezela ngenkxaso epheleleyo yenkonzo:
1.Ukwenza ngokwezifiso ubukhulu:
Sinikezela ngezixhobo eziziisentimitha ezili-12 kwiinkcukacha ezahlukeneyo zobukhulu kuquka ne-725μm ukuhlangabezana neemfuno ezahlukeneyo zokusetyenziswa.
2. Uxinzelelo lwe-Doping:
Ukwenziwa kwethu kuxhasa iintlobo ezininzi zokuqhuba umbane kuquka ii-substrates ze-n-type kunye ne-p-type, kunye nolawulo oluchanekileyo lokumelana nombane kuluhlu lwe-0.01-0.02Ω·cm.
3. Iinkonzo zoVavanyo:
Ngezixhobo zovavanyo ezipheleleyo zenqanaba le-wafer, sinikezela ngeengxelo ezipheleleyo zovavanyo.
I-XKH iyaqonda ukuba umthengi ngamnye uneemfuno ezizodwa ze-substrates ze-SiC eziyi-12-intshi. Ngoko ke sinikezela ngeemodeli zentsebenziswano yeshishini eziguquguqukayo ukubonelela ngezisombululo ezikhuphisanayo, nokuba zezo:
· Iisampuli ze-R&D
· Ukuthengwa kwemveliso yomthamo
Iinkonzo zethu ezenzelwe wena ziqinisekisa ukuba singahlangabezana neemfuno zakho zobugcisa nezemveliso ze-substrates ze-SiC eziyi-12-intshi.









