I-12 intshi ye-SIC substrate i-silicon carbide prime grade diameter 300mm enkulu ubukhulu 4H-N Ifanelekile ukusasaza ubushushu besixhobo esinamandla aphezulu
Iimpawu zemveliso
1. Ubushushu obuphezulu: Ubushushu obuphezulu be-silicon carbide bungaphezulu ngokuphindwe kathathu kunobe-silicon, nto leyo efanelekileyo ekuchitheni ubushushu besixhobo esinamandla aphezulu.
2. Amandla entsimi yokuqhekeka okuphezulu: Amandla entsimi yokuqhekeka aphindwe kalishumi kune-silicon, afanelekileyo ukusetyenziswa koxinzelelo oluphezulu.
3. Isithuba esibanzi sebhendi: Isithuba sebhendi yi-3.26eV (4H-SiC), ifanelekile kwiindlela zokushisa eziphezulu kunye nokusetyenziswa rhoqo.
4. Ubunzima obuphezulu: Ubunzima beMohs buyi-9.2, bulandela idayimani kuphela, bumelana nokuguguleka okugqwesileyo kunye namandla oomatshini.
5. Uzinzo lweekhemikhali: ukumelana nokugqwala okunamandla, ukusebenza okuzinzileyo kumaqondo obushushu aphezulu nakwimeko enzima.
6. Ubukhulu obukhulu: i-substrate eyi-12 intshi (300mm), iphucula ukusebenza kakuhle kwemveliso, inciphise iindleko zeyunithi.
7. Uxinano oluphantsi lweziphene: iteknoloji yokukhula kwekristale enye ekumgangatho ophezulu ukuqinisekisa uxinano oluphantsi lweziphene kunye nokuhambelana okuphezulu.
Isikhokelo sesicelo esiphambili semveliso
1. Izixhobo zombane:
IiMosfets: Zisetyenziswa kwizithuthi zombane, kwiimoto zemizi-mveliso kunye nakwizixhobo zokuguqula amandla.
Iidiode: ezifana neediode zeSchottky (SBD), ezisetyenziselwa ukulungisa nokutshintsha izixhobo zamandla ngokufanelekileyo.
2. Izixhobo ze-Rf:
I-amplifier yamandla e-Rf: isetyenziswa kwizikhululo zonxibelelwano ze-5G kunye nonxibelelwano lwesathelayithi.
Izixhobo ze-microwave: Zifanelekile kwiinkqubo zonxibelelwano ze-radar kunye nee-wireless.
3. Iimoto ezintsha zamandla:
Iinkqubo zokuqhuba ngombane: abalawuli beemoto kunye nee-inverters zezithuthi zombane.
Inqwaba yokutshaja: Imodyuli yamandla yezixhobo zokutshaja ngokukhawuleza.
4. Izicelo zoshishino:
I-inverter ye-voltage ephezulu: yokulawula iimoto zoshishino kunye nolawulo lwamandla.
Igridi ekrelekrele: Yeetransfera ze-HVDC kunye neetransfera ze-elektroniki zamandla.
5. Inqwelo-moya:
Izixhobo ze-elektroniki ezinobushushu obuphezulu: zifanelekile kwiindawo ezinobushushu obuphezulu zezixhobo zeenqwelo-moya.
6. Intsimi yophando:
Uphando olubanzi lwe-bandgap semiconductor: lokuphuhlisa izixhobo kunye nezixhobo ezintsha ze-semiconductor.
I-substrate ye-silicon carbide eyi-intshi ezili-12 luhlobo lwe-substrate yezinto ze-semiconductor ezisebenzayo eziphezulu ezineempawu ezintle ezifana nokuqhuba okuphezulu kobushushu, amandla entsimi aqhekekileyo aphezulu kunye nomsantsa webhendi ebanzi. Isetyenziswa kakhulu kwi-electronics zamandla, izixhobo zerediyo, izithuthi zamandla amatsha, ulawulo lwemizi-mveliso kunye ne-aerospace, kwaye sisixhobo esibalulekileyo sokukhuthaza uphuhliso lwesizukulwana esilandelayo sezixhobo ze-elektroniki ezisebenzayo nezinamandla aphezulu.
Nangona ii-substrates ze-silicon carbide okwangoku zinokusetyenziswa okuncinci ngokuthe ngqo kwii-elektroniki zabathengi ezifana neeglasi ze-AR, amandla azo ekulawuleni amandla ngokufanelekileyo kunye nee-elektroniki ezincinci zinokuxhasa izisombululo zombane ezilula nezisebenza kakuhle kwizixhobo ze-AR/VR zexesha elizayo. Okwangoku, uphuhliso oluphambili lwe-substrate ye-silicon carbide lugxile kwiinkalo zoshishino ezifana nezithuthi zamandla amatsha, iziseko zonxibelelwano kunye nokuzisebenzela ngokuzenzekelayo kwezoshishino, kwaye lukhuthaza ishishini le-semiconductor ukuba liphuhlise kwicala elisebenzayo nelinokuthenjwa.
I-XKH izibophelele ekuboneleleni ngeziseko ze-SIC ezili-12 ezisemgangathweni ophezulu kunye nenkxaso yobugcisa kunye neenkonzo ezipheleleyo, kuquka:
1. Imveliso eyenzelwe wena: Ngokweemfuno zabathengi ukubonelela ngokumelana okwahlukileyo, ukujongwa kwekristale kunye nesiseko sonyango lomphezulu.
2. Ukuphucula inkqubo: Ukubonelela abathengi ngenkxaso yobuchwepheshe yokukhula kwe-epitaxial, ukwenziwa kwezixhobo kunye nezinye iinkqubo zokuphucula ukusebenza kwemveliso.
3. Uvavanyo kunye nesiqinisekiso: Nika ukufunyanwa kweziphene okungqongqo kunye nesiqinisekiso somgangatho ukuqinisekisa ukuba isiseko siyahlangabezana nemigangatho yoshishino.
4. Intsebenziswano yeR&D: Baphuhlise izixhobo ezintsha ze-silicon carbide kunye nabathengi ukukhuthaza ubuchule bobuchwephesha.
Itshathi yedatha
| Inkcazelo ye-Substrate yeSilicon Carbide (SiC) eyi-1 2 intshi | |||||
| Ibanga | Imveliso yeZeroMPD Ibanga (Ibanga le-Z) | Imveliso Esemgangathweni Ibanga (Ibanga le-P) | Ibanga elingeyonyani (Ibanga le-D) | ||
| Ububanzi | 3 0 0 mm~305mm | ||||
| Ubukhulu | 4H-N | 750μm±15 μm | 750μm±25 μm | ||
| 4H-SI | 750μm±15 μm | 750μm±25 μm | |||
| Uqeqesho lweWafer | I-axis engasebenziyo: 4.0° ukuya kwi-<1120 >±0.5° kwi-4H-N, I-axis engasebenziyo: <0001>±0.5° kwi-4H-SI | ||||
| Uxinano lweeMipayipi ezincinci | 4H-N | ≤0.4cm-2 | ≤4cm-2 | ≤25cm-2 | |
| 4H-SI | ≤5cm-2 | ≤10cm-2 | ≤25cm-2 | ||
| Ukuxhathisa | 4H-N | 0.015~0.024 Ω·cm | 0.015~0.028 Ω·cm | ||
| 4H-SI | ≥1E10 Ω·cm | ≥1E5 Ω·cm | |||
| Uqhelaniso oluPhambili oluSicaba | {10-10} ±5.0° | ||||
| Ubude obuPhambili obuSicaba | 4H-N | N / A | |||
| 4H-SI | I-Notch | ||||
| Ukukhutshwa komda | 3 mm | ||||
| I-LTV/TTV/Isaphetha/I-Warp | ≤5μm/≤15μm/≤35 μm/≤55 μm | ≤5μm/≤15μm/≤35 □ μm/≤55 □ μm | |||
| Uburhabaxa | I-Polish Ra≤1 nm | ||||
| I-CMP Ra≤0.2 nm | I-Ra≤0.5 nm | ||||
| Iimfanta zoMphetho ngokukhanya okuphezulu Iipleyiti zeHex Ngokukhanya Okuphezulu Kobungqingqwa Iindawo zePolytype Ngokukhanya Okuphezulu Izinto ezibandakanyiweyo zeCarbon ezibonakalayo Imikrwelo yomphezulu weSilicone Ngokukhanya Okuphezulu | Akukho nanye Indawo eqokelelweyo ≤0.05% Akukho nanye Indawo eqokelelweyo ≤0.05% Akukho nanye | Ubude obuqokelelweyo ≤ 20 mm, ubude obunye ≤2 mm Indawo eqokelelweyo ≤0.1% Indawo eqokelelweyo≤3% Indawo eqokelelweyo ≤3% Ubude obuqokelelweyo ≤1 × ububanzi besitya esisicaba | |||
| Iitships zomphetho ngokukhanya okuphezulu | Akukho kuvunyelweyo ububanzi nobunzulu obuyi-≥0.2mm | 7 zivunyelwe, ≤1 mm nganye | |||
| (TSD) Ukususwa kwesikrufu sokutsala imisonto | ≤500 cm-2 | N / A | |||
| (BPD) Ukususwa kwesiseko sendiza | ≤1000 cm-2 | N / A | |||
| Ungcoliseko lweSilicon Surface Lubangelwa kukukhanya okuPhakamileyo | Akukho nanye | ||||
| Ukupakisha | Ikhasethi yeewafer ezininzi okanye isitya sewafer esinye | ||||
| Amanqaku: | |||||
| 1 Imida yeziphene isebenza kumphezulu we-wafer yonke ngaphandle kwendawo yokukhupha umphetho. 2 Imikrwelo mayijongwe ebusweni bukaSi kuphela. 3 Idatha yokwahlukana kwesakhiwo ivela kwiiwafers eziqoshiweyo ze-KOH kuphela. | |||||
I-XKH iza kuqhubeka nokutyala imali kuphando nophuhliso ukuze ikhuthaze impumelelo ye-substrates ze-silicon carbide eziyi-12-intshi ngobukhulu obukhulu, iziphene eziphantsi kunye nokuhambelana okuphezulu, ngelixa i-XKH ihlola usetyenziso lwayo kwiindawo ezintsha ezifana ne-electronics zabathengi (ezifana neemodyuli zamandla zezixhobo ze-AR/VR) kunye ne-quantum computing. Ngokunciphisa iindleko kunye nokwandisa amandla, i-XKH iya kuzisa impumelelo kushishino lwe-semiconductor.
Umzobo oneenkcukacha









