IiWafers zeSilicon Carbide ezizi-3 intshi eziQinisekileyo (ezingafakwanga) zeSilicon Carbide Substrates (HPSl)
Iipropati
1. Iimpawu zeMpawu nezeZakhiwo
●Uhlobo lwezinto: Ucoceko Oluphezulu (Olungafakwanga) I-Silicon Carbide (SiC)
●Ububanzi: 3 intshi (76.2 mm)
●Ubukhulu: 0.33-0.5 mm, inokwenziwa ngokwezifiso ngokusekelwe kwiimfuno zesicelo.
●Ulwakhiwo lwekristale: I-polytype ye-4H-SiC ene-lattice ene-hexagonal, eyaziwa ngokuhamba okuphezulu kwe-electron kunye nokuzinza kobushushu.
●Ukuqhelanisa:
oStandard: [0001] (C-plane), ifanelekile kwiintlobo ngeentlobo zezicelo.
oOnganyanzelekanga: I-Off-axis (4° okanye 8° tilt) yokukhulisa i-epitaxial yeeleya zesixhobo.
●Ubucaba: Ukwahluka kobukhulu obupheleleyo (TTV) ●Umgangatho womphezulu:
o Ipolished ukuya kwi-o Uxinano oluphantsi (<10/cm² Uxinano lwemibhobho emincinci). 2. Iipropati zoMbane ●Ukumelana: >109^99 Ω·cm, igcinwa ngokususa izinto ezingafunekiyo.
●Ukuqina kweDielectric: Ukunyamezela kwe-voltage ephezulu kunye nokulahleka okuncinci kwe-dielectric, ilungele ukusetyenziswa kwamandla aphezulu.
●Ukuqhuba Ubushushu: 3.5-4.9 W/cm·K, okuvumela ukusasazwa kobushushu okusebenzayo kwizixhobo ezisebenza kakuhle.
3. Iipropati zoBushushu kunye nezobuMechanical
●Isithuba sebhendi ebanzi: 3.26 eV, exhasa ukusebenza phantsi kwevolthi ephezulu, ubushushu obuphezulu, kunye neemeko zokukhanya okuphezulu.
●Ukuqina: Isikali se-Mohs 9, siqinisekisa ukuqina ngokuchasene nokuguguleka koomatshini ngexesha lokucubungula.
●I-Coefficient yoKwandiswa kobushushu: 4.2×10−6/K4.2 \times 10^{-6}/\text{K}4.2×10−6/K, ukuqinisekisa uzinzo lobukhulu phantsi kotshintsho lobushushu.
| Ipharamitha | Ibanga leMveliso | Ibanga loPhando | Ibanga elingeyonyani | Iyunithi |
| Ibanga | Ibanga leMveliso | Ibanga loPhando | Ibanga elingeyonyani | |
| Ububanzi | 76.2 ± 0.5 | 76.2 ± 0.5 | 76.2 ± 0.5 | mm |
| Ubukhulu | 500 ± 25 | 500 ± 25 | 500 ± 25 | µm |
| Uqeqesho lweWafer | I-On-axis: <0001> ± 0.5° | I-On-axis: <0001> ± 2.0° | I-On-axis: <0001> ± 2.0° | isidanga |
| Uxinano lweeMipayipi ezincinci (MPD) | ≤ 1 | ≤ 5 | ≤ 10 | cm−2^-2−2 |
| Ukumelana nombane | ≥ 1E10 | ≥ 1E5 | ≥ 1E5 | Ω·cm |
| I-Dopant | Ayivulwanga | Ayivulwanga | Ayivulwanga | |
| Uqhelaniso oluPhambili oluSicaba | {1-100} ± 5.0° | {1-100} ± 5.0° | {1-100} ± 5.0° | isidanga |
| Ubude obuPhambili obuSicaba | 32.5 ± 3.0 | 32.5 ± 3.0 | 32.5 ± 3.0 | mm |
| Ubude obuSicaba beSibini | 18.0 ± 2.0 | 18.0 ± 2.0 | 18.0 ± 2.0 | mm |
| Ulwazelelelo lweSibini oluSicaba | 90° CW ukusuka kwiflethi yokuqala ± 5.0° | 90° CW ukusuka kwiflethi yokuqala ± 5.0° | 90° CW ukusuka kwiflethi yokuqala ± 5.0° | isidanga |
| Ukukhutshwa komda | 3 | 3 | 3 | mm |
| I-LTV/TTV/Isaphetha/I-Warp | 3 / 10 / ±30 / 40 | 3 / 10 / ±30 / 40 | 5 / 15 / ±40 / 45 | µm |
| Uburhabaxa bomphezulu | Ubuso obu-Si: CMP, ubuso obu-C: Bukhazimlisiwe | Ubuso obu-Si: CMP, ubuso obu-C: Bukhazimlisiwe | Ubuso obu-Si: CMP, ubuso obu-C: Bukhazimlisiwe | |
| Iintanda (Ukukhanya Okunamandla Aphezulu) | Akukho nanye | Akukho nanye | Akukho nanye | |
| Iipleyiti zeHex (Ukukhanya Okuphezulu) | Akukho nanye | Akukho nanye | Indawo eqokelelweyo yi-10% | % |
| Iindawo zePolytype (Ukukhanya Okuphezulu) | Indawo eqokelelweyo yi-5% | Indawo eqokelelweyo yi-20% | Indawo eqokelelweyo yi-30% | % |
| Imikrwelo (Ukukhanya Okuphezulu) | ≤ imikrwelo emi-5, ubude obudibeneyo ≤ 150 | ≤ imikrwelo eli-10, ubude obudibeneyo ≤ 200 | ≤ imikrwelo eli-10, ubude obudibeneyo ≤ 200 | mm |
| Ukuqhekeza Umphetho | Akukho nto ≥ 0.5 mm ububanzi/ubunzulu | 2 zivunyelwe ≤ 1 mm ububanzi/ubunzulu | 5 ivumelekile ≤ 5 mm ububanzi/ubunzulu | mm |
| Ungcoliseko lomphezulu | Akukho nanye | Akukho nanye | Akukho nanye |
Izicelo
1. Izixhobo zombane zamandla
I-bandgap ebanzi kunye nokuqhuba okuphezulu kobushushu be-HPSI SiC substrates kuzenza zilungele izixhobo zamandla ezisebenza kwiimeko eziqatha, ezinje:
●Izixhobo zeVoltage ephezulu: Kubandakanya iiMOSFET, ii-IGBT, kunye neeSchottky Barrier Diodes (ii-SBD) ukuze kuguqulwe amandla ngokufanelekileyo.
●Iinkqubo zamandla avuselelekayo: Ezifana nee-solar inverters kunye nezilawuli ze-wind turbine.
●Iimoto zombane (ii-EV): Zisetyenziswa kwii-inverters, kwiitshaja, nakwiinkqubo ze-powertrain ukuphucula ukusebenza kakuhle nokunciphisa ubungakanani.
2. Usetyenziso lwe-RF kunye ne-Microwave
Ukumelana okuphezulu kunye nokulahleka okuphantsi kwe-dielectric kwee-HPSI wafers kubalulekile kwiinkqubo ze-radio-frequency (RF) kunye neenkqubo ze-microwave, kuquka:
●Iziseko zoNxibelelwano: Izitishi ezisisiseko zeenethiwekhi ze-5G kunye nonxibelelwano lwesathelayithi.
●Indawo yomoya kunye noKhuselo: Iinkqubo zeRadar, ii-antenna ezifakwe izigaba, kunye nezinto ze-avionics.
3. I-Optoelectronics
Ukucaca kunye ne-bandgap ebanzi ye-4H-SiC ivumela ukusetyenziswa kwayo kwizixhobo ze-optoelectronic, ezifana:
●Iifoto ze-UV: Zokujonga imeko-bume kunye nokuxilongwa kwezonyango.
●Ii-LED ezinamandla aphezulu: Zixhasa iinkqubo zokukhanyisa eziqinileyo.
●Iidayiode zeLaser: Zenzelwe ukusetyenziswa kwemizi-mveliso kunye nezonyango.
4. Uphando noPhuhliso
Ii-substrates ze-HPSI SiC zisetyenziswa kakhulu kwiilebhu ze-R&D zezemfundo nezemizi-mveliso ukuze kuhlolwe iipropati zezinto ezisemgangathweni kunye nokwenziwa kwezixhobo, kuquka:
●Ukukhula KweeLeya ze-Epitaxial: Izifundo zokunciphisa iziphene kunye nokwenza ngcono iileya.
●Izifundo Zokuhamba Komthwali: Uphando lokuthuthwa kwee-electron kunye nemingxunya kwizinto ezicocekileyo kakhulu.
●Umzekelo: Uphuhliso lokuqala lwezixhobo ezintsha kunye neesekethe.
Iingenelo
Umgangatho oPhezulu:
Ubunyulu obuphezulu kunye noxinano oluphantsi lweziphene zibonelela ngeqonga elithembekileyo lezicelo eziphambili.
Uzinzo lobushushu:
Iimpawu ezintle zokusasaza ubushushu zivumela izixhobo ukuba zisebenze ngokufanelekileyo phantsi kwamandla aphezulu kunye neemeko zobushushu.
Ukuhambelana Okubanzi:
Iindlela ezikhoyo zokuqhelanisa kunye neendlela zokukhetha ubukhulu obukhethekileyo ziqinisekisa ukuba ziyahambelana neemfuno ezahlukeneyo zesixhobo.
Ukuqina:
Ubulukhuni obungaqhelekanga kunye nokuzinza kwesakhiwo kunciphisa ukuguguleka kunye nokuguquguquka ngexesha lokucubungula nokusebenza.
Ukuguquguquka:
Ifanelekile kumashishini amaninzi, ukusuka kumandla avuselelekayo ukuya kwi-aerospace kunye nonxibelelwano.
Isiphelo
I-wafer ye-Silicon Carbide ene-High Purity Semi-Insulating eyi-3 intshi imele eyona teknoloji ibalaseleyo ye-substrate kwizixhobo ezinamandla aphezulu, ezisebenzisa i-frequency ephezulu, kunye ne-optoelectronic. Ukudibanisa kwayo iipropati ezigqwesileyo zobushushu, zombane, kunye nezoomatshini kuqinisekisa ukusebenza okuthembekileyo kwiindawo ezinzima. Ukusuka kwiinkqubo ze-elektroniki zamandla kunye neenkqubo ze-RF ukuya kwi-optoelectronics kunye ne-R&D ephucukileyo, ezi substrates ze-HPSI zibonelela ngesiseko sezinto ezintsha zangomso.
Ukuze ufumane ulwazi oluthe kratya okanye ukufaka iodolo, nceda unxibelelane nathi. Iqela lethu lobuchwephesha liyafumaneka ukubonelela ngesikhokelo kunye neendlela zokwenza ngokwezifiso ezilungiselelwe iimfuno zakho.
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