I-HPSI SiC Wafer ≥90% iBanga le-Optical Transmittance ye-AI/AR Glasses
Intshayelelo engundoqo: Indima ye-HPSI SiC Wafers kwiiglasi ze-AI/AR
I-HPSI (I-High-Purity Semi-Insulating) I-Silicon Carbide wafers ziziphaluka ezikhethekileyo eziphawulwa ngokumelana okuphezulu (>10⁹ Ω·cm) kunye noxinzelelo oluphantsi kakhulu lwesiphene. Kwiiglasi ze-AI / AR, ngokuyintloko zisebenza njengeyona nto iphambili ye-substrate lens ye-diffractive optical waveguide lens, ijongana neebhotile ezinxulunyaniswa nemathiriyeli yemveli ye-optical ngokwemiba yefom ebhityileyo kunye nokukhanya, ukuchithwa kobushushu, kunye nokusebenza kwamehlo. Umzekelo, iiglasi ze-AR zisebenzisa iilensi ze-SiC waveguide zinokufikelela kwindawo yokujonga ebanzi kakhulu (FOV) ye-70 ° -80 °, ngelixa inciphisa ubukhulu bomaleko welensi enye ukuya kwi-0.55mm kunye nobunzima ukuya kwi-2.7g nje, kuphucula kakhulu ukunxiba intuthuzelo kunye nokuntywiliselwa okubonakalayo.
Iimpawu eziphambili: Indlela iSiC Material exhobisa ngayo i-AI/AR Glasses Design
Isalathiso esiPheleleyo esiPheleleyo esiPhezulu kunye nokuPhunyezwa koMsebenzi wokuSebenza
- Isalathisi se-SiC's refractive index (2.6-2.7) siphantse sibe ngama-50% aphezulu kuneglasi yendabuko (1.8-2.0). Oku kuvumela ulwakhiwo oluncinci kunye olusebenzayo ngakumbi lwe-waveguide, ukwandisa kakhulu i-FOV. Isalathiso se-refractive ephezulu sikwanceda ukucinezela "isiphumo somnyama" esixhaphakileyo kwi-diffractive waveguides, ukuphucula ukucoceka komfanekiso.
Ubuchule bokuLawula iThermal
- Nge-thermal conductivity ephezulu njenge-490 W/m·K (kufuphi naleyo yobhedu), i-SiC inokuphelisa ngokukhawuleza ubushushu obuveliswe ziimodyuli zokubonisa iMicro-LED. Oku kuthintela ukuthotywa kokusebenza okanye ukuguga kwesixhobo ngenxa yobushushu obuphezulu, ukuqinisekisa ubomi obude bebhetri kunye nokuzinza okuphezulu.
Amandla oomatshini kunye noKuhlala ixesha elide
- I-SiC inobulukhuni be-Mohs obuyi-9.5 (yesibini kuphela kwidayimane), inika ukuxhathisa okungaqhelekanga kokukrweleka, oko kuyenza ilungele iiglasi ezisetyenziswa rhoqo. Uburhabaxa bayo bomphezulu bunokulawulwa ukuya kuRa <0.5 nm, kuqinisekisa ilahleko ephantsi kunye nokuhanjiswa kokukhanya okufanayo kwiindlela zamaza.
Ukuhambelana kwePropati yoMbane
- Ukuxhathisa kwe-HPSI SiC (>10⁹ Ω·cm) inceda ukuthintela ukuphazamiseka kophawu. Inokuthi isebenze njengesixhobo esisebenzayo sesixhobo samandla, ikhulisa iimodyuli zolawulo lwamandla kwiiglasi ze-AR.
Imiyalelo yeSicelo esiPhambili
Amacandelo aMacho angundoqo we-AI/AR Glasses
- IiLensi ze-Waveguide Diffractive: Ii-substrates ze-SiC zisetyenziselwa ukwenza i-ultra-thin optical waveguides exhasa i-FOV enkulu kunye nokupheliswa kwesiphumo somnyama.
- Iipleyiti zeWindow kunye neePrisms: Ngokusikwa ngokwezifiso kunye nokupolisha, i-SiC inokucutshungulwa kwiifestile ezikhuselayo okanye iiprism ezibonakalayo kwiiglasi ze-AR, ukuphucula ukuhanjiswa kokukhanya kunye nokumelana nokunxiba.
Izicelo ezandisiweyo kweminye iMiba
- I-Electronics yamandla: Isetyenziswa kwi-high-frequency, iimeko zamandla aphezulu njengeziguquli zemoto zamandla amatsha kunye nolawulo lweemoto zamashishini.
- I-Quantum Optics: Isebenza njengenginginya kumaziko ombala, asetyenziswa kwii-substrates zonxibelelwano lwe-quantum kunye nezixhobo zokuva.
I-intshi ezi-4 kunye ne-6 ye-intshi ye-HPSI ye-SiC yeNkcazo yeNkcazelo yeNkcazo yoNcitho
| Ipharamitha | IBanga | 4-Intshi Substrate | 6-Intshi Substrate |
| Ububanzi | IBanga le-Z / D | 99.5 mm - 100.0 mm | 149.5 mm - 150.0 mm |
| Uhlobo lwePoly | IBanga le-Z / D | 4H | 4H |
| Ukutyeba | IBanga le-Z | 500 μm ± 15 μm | 500 μm ± 15 μm |
| D iBanga | 500 μm ± 25 μm | 500 μm ± 25 μm | |
| I-Wafer Orientation | IBanga le-Z / D | Kwi-axis: <0001> ± 0.5 ° | Kwi-axis: <0001> ± 0.5 ° |
| Uxinzelelo lweMicropipe | IBanga le-Z | ≤ 1cm² | ≤ 1cm² |
| D iBanga | ≤ 15cm² | ≤ 15cm² | |
| Ukuxhathisa | IBanga le-Z | ≥ 1E10 Ω·cm | ≥ 1E10 Ω·cm |
| D iBanga | ≥ 1E5 Ω·cm | ≥ 1E5 Ω·cm | |
| Ukuqhelaniswa neFlat okuPhambili | IBanga le-Z / D | (10-10) ± 5.0 ° | (10-10) ± 5.0 ° |
| Ubude obuPhambili beFlathi | IBanga le-Z / D | 32.5 mm ± 2.0 mm | Inotshi |
| Ubude beFlethi yesibini | IBanga le-Z / D | 18.0 mm ± 2.0 mm | - |
| Ukukhutshwa kwe-Edge | IBanga le-Z / D | 3 mm | 3 mm |
| LTV / TTV / Isaphetha / Warp | IBanga le-Z | ≤ 2.5 μm / ≤ 5 μm / ≤ 15 μm / ≤ 30 μm | ≤ 2.5 μm / ≤ 6 μm / ≤ 25 μm / ≤ 35 μm |
| D iBanga | ≤ 10 μm / ≤ 15 μm / ≤ 25 μm / ≤ 40 μm | ≤ 5 μm / ≤ 15 μm / ≤ 40 μm / ≤ 80 μm | |
| Uburhabaxa | IBanga le-Z | I-Polish Ra ≤ 1 nm / CMP Ra ≤ 0.2 nm | I-Polish Ra ≤ 1 nm / CMP Ra ≤ 0.2 nm |
| D iBanga | I-Polish Ra ≤ 1 nm / CMP Ra ≤ 0.2 nm | I-Polish Ra ≤ 1 nm / CMP Ra ≤ 0.5 nm | |
| Ii-Edge Cracks | D iBanga | Indawo eyongezelekayo ≤ 0.1% | Ubude obuqokelelweyo ≤ 20 mm, eyodwa ≤ 2 mm |
| Iindawo zePolytype | D iBanga | Indawo eyongezelekayo ≤ 0.3% | Indawo eyongezelekayo ≤ 3% |
| Ukubandakanywa kweCarbon ebonakalayo | IBanga le-Z | Indawo eyongezelekayo ≤ 0.05% | Indawo eyongezelekayo ≤ 0.05% |
| D iBanga | Indawo eyongezelekayo ≤ 0.3% | Indawo eyongezelekayo ≤ 3% | |
| Imikrwelo yoMphezulu weSilicon | D iBanga | I-5 ivunyelwe, nganye ≤1mm | Ubude obongezelekayo ≤ 1 x idayamitha |
| Ii-Edge chips | IBanga le-Z | Akukho kuvunyelweyo (ububanzi nobunzulu ≥0.2mm) | Akukho kuvunyelweyo (ububanzi nobunzulu ≥0.2mm) |
| D iBanga | I-7 ivunyelwe, nganye ≤1mm | I-7 ivunyelwe, nganye ≤1mm | |
| Ukukhutshwa kwe-Screw Dislocation | IBanga le-Z | - | ≤ 500 cm² |
| Ukupakisha | IBanga le-Z / D | Multi-wafer Cassette Okanye Single Wafer Container | Multi-wafer Cassette Okanye Single Wafer Container |
Iinkonzo ze-XKH: ukuVelisa okuDityanisiweyo kunye neZakhono zokuLungisa
Inkampani ye-XKH inamandla okudibanisa ngokuthe nkqo ukusuka kwimathiriyeli ekrwada ukuya kwii-wafers ezigqityiweyo, ezigubungela lonke ikhonkco lokukhula kwe-SiC substrate, ukusika, ukupolisha, kunye nokusetyenzwa kwesiko. Iinzuzo eziphambili zenkonzo ziquka:
- Ukwahluka kwezinto:Sinokubonelela ngeentlobo ezahlukeneyo ze-wafer ezifana nohlobo lwe-4H-N, uhlobo lwe-4H-HPSI, uhlobo lwe-4H / 6H-P, kunye nohlobo lwe-3C-N. Ukuxhathisa, ubukhulu, kunye nokuqhelaniswa kunokulungiswa ngokweemfuno.
- .Ubungakanani obuguquguqukayo ngokwezifiso:Sixhasa ukusetyenzwa kwe-wafer ukusuka kwi-intshi ezi-2 ukuya kwi-12-intshi yedayamitha, kwaye singakwazi ukucubungula izakhiwo ezikhethekileyo njengeziqwenga zesikwere (umzekelo, 5x5mm, 10x10mm) kunye neeprism ezingaqhelekanga.
- Ulawulo oluchanekileyo lweBanga lokuSebenza:I-Wafer Total Thickness Variation (TTV) inokugcinwa kwi-<1μm, kunye nobunzima bomhlaba kwi-Ra <0.3 nm, ukuhlangabezana neemfuno ze-nano-level flatness yezixhobo ze-waveguide.
- Impendulo yeMarike eKhawulezayo:Imodeli yoshishino edibeneyo iqinisekisa utshintsho olusebenzayo ukusuka kwi-R & D ukuya kwimveliso yobuninzi, ukuxhasa yonke into ukusuka ekuqinisekisweni kwe-batch encinci ukuya kwiimpahla ezinkulu (ixesha lokukhokela ngokuqhelekileyo iintsuku ze-15-40).

FAQ ye-HPSI SiC Wafer
Q1: Kutheni i-HPSI SiC ithathwa njengesixhobo esifanelekileyo kwiilensi ze-AR waveguide?
I-A1: Isalathisi sayo esiphezulu se-refractive (2.6-2.7) senza ukuba kube lula, izakhiwo ze-waveguide ezisebenzayo ezixhasa indawo enkulu yokujonga (umzekelo, i-70 ° -80 °) ngelixa ususa "umphumela we-rainbow".
I-Q2: I-HPSI SiC iluphucula njani ulawulo lobushushu kwiiglasi ze-AI/AR?
I-A2: Nge-thermal conductivity ukuya kwi-490 W / m · K (kufuphi nobhedu), ikhupha ngokufanelekileyo ubushushu obuvela kumacandelo afana ne-Micro-LEDs, iqinisekisa ukusebenza okuzinzile kunye nexesha elide lesixhobo.
Q3: Zeziphi iingenelo zokuqina ezibonelelwa yi-HPSI SiC kwiindondo ezinxitywayo?
I-A3: Ukuqina kwayo okungaqhelekanga (i-Mohs 9.5) inika ukuxhathisa okuphezulu, okwenza kube yinto ehlala ixesha elide lokusetyenziswa kwansuku zonke kwiiglasi ze-AR zabathengi.













