I-12 intshi ye-SiC Substrate N Uhlobo Olukhulu Ubungakanani Obuphezulu Usetyenziso lweRF
Iiparameter zobugcisa
| Inkcazelo ye-Substrate ye-Silicon Carbide (SiC) ye-intshi ezili-12 | |||||
| Ibanga | Imveliso yeZeroMPD Ibanga (Ibanga le-Z) | Imveliso Esemgangathweni Ibanga (Ibanga le-P) | Ibanga elingeyonyani (Ibanga le-D) | ||
| Ububanzi | 3 0 0 mm~1305mm | ||||
| Ubukhulu | 4H-N | 750μm±15 μm | 750μm±25 μm | ||
| 4H-SI | 750μm±15 μm | 750μm±25 μm | |||
| Uqeqesho lweWafer | I-axis engasebenziyo: 4.0° ukuya kwi-<1120 >±0.5° kwi-4H-N, I-axis engasebenziyo: <0001>±0.5° kwi-4H-SI | ||||
| Uxinano lweeMipayipi ezincinci | 4H-N | ≤0.4cm-2 | ≤4cm-2 | ≤25cm-2 | |
| 4H-SI | ≤5cm-2 | ≤10cm-2 | ≤25cm-2 | ||
| Ukuxhathisa | 4H-N | 0.015~0.024 Ω·cm | 0.015~0.028 Ω·cm | ||
| 4H-SI | ≥1E10 Ω·cm | ≥1E5 Ω·cm | |||
| Uqhelaniso oluPhambili oluSicaba | {10-10} ±5.0° | ||||
| Ubude obuPhambili obuSicaba | 4H-N | N / A | |||
| 4H-SI | I-Notch | ||||
| Ukukhutshwa komda | 3 mm | ||||
| I-LTV/TTV/Isaphetha/I-Warp | ≤5μm/≤15μm/≤35 μm/≤55 μm | ≤5μm/≤15μm/≤35 □ μm/≤55 □ μm | |||
| Uburhabaxa | I-Polish Ra≤1 nm | ||||
| I-CMP Ra≤0.2 nm | I-Ra≤0.5 nm | ||||
| Iimfanta zoMphetho ngokukhanya okuphezulu Iipleyiti zeHex Ngokukhanya Okuphezulu Kobungqingqwa Iindawo zePolytype Ngokukhanya Okuphezulu Izinto ezibandakanyiweyo zeCarbon ezibonakalayo Imikrwelo yomphezulu weSilicone Ngokukhanya Okuphezulu | Akukho nanye Indawo eqokelelweyo ≤0.05% Akukho nanye Indawo eqokelelweyo ≤0.05% Akukho nanye | Ubude obuqokelelweyo ≤ 20 mm, ubude obunye ≤2 mm Indawo eqokelelweyo ≤0.1% Indawo eqokelelweyo≤3% Indawo eqokelelweyo ≤3% Ubude obuqokelelweyo ≤1 × ububanzi besitya esisicaba | |||
| Iitships zomphetho ngokukhanya okuphezulu | Akukho kuvunyelweyo ububanzi nobunzulu obuyi-≥0.2mm | 7 zivunyelwe, ≤1 mm nganye | |||
| (TSD) Ukususwa kwesikrufu sokutsala imisonto | ≤500 cm-2 | N / A | |||
| (BPD) Ukususwa kwesiseko sendiza | ≤1000 cm-2 | N / A | |||
| Ungcoliseko lweSilicon Surface Lubangelwa kukukhanya okuPhakamileyo | Akukho nanye | ||||
| Ukupakisha | Ikhasethi yeewafer ezininzi okanye isitya sewafer esinye | ||||
| Amanqaku: | |||||
| 1 Imida yeziphene isebenza kumphezulu we-wafer yonke ngaphandle kwendawo yokukhupha umphetho. 2 Imikrwelo mayijongwe ebusweni bukaSi kuphela. 3 Idatha yokwahlukana kwesakhiwo ivela kwiiwafers eziqoshiweyo ze-KOH kuphela. | |||||
Ezona mpawu
1. Inzuzo yobukhulu obukhulu: I-substrate ye-SiC eyi-intshi ezili-12 (i-substrate ye-silicon carbide eyi-intshi ezili-12) inika indawo enkulu ye-single-wafer, nto leyo evumela ukuba kuveliswe iitships ezininzi nge-wafer nganye, ngaloo ndlela kunciphisa iindleko zokuvelisa kunye nokwandisa isivuno.
2. Izinto Ezisebenza Ngobuninzi: Ukumelana nobushushu obuphezulu be-silicon carbide kunye namandla entsimi aphantsi kwenza i-substrate eyi-12-intshi ifaneleke kakhulu kwizicelo ze-voltage ephezulu kunye ne-frequency ephezulu, ezifana nee-EV inverters kunye neenkqubo zokutshaja ngokukhawuleza.
3. Ukuhambelana Kokusebenza: Nangona iSiC inobunzima obukhulu kunye nemingeni yokucubungula, i-substrate yeSiC eyi-12-intshi ifikelela kwiziphene eziphantsi zomphezulu ngokusebenzisa iindlela zokusika nokupholisha eziphuculiweyo, nto leyo ephucula imveliso yesixhobo.
4. Ulawulo Oluphezulu Lobushushu: Ngombane ongcono wobushushu kunezixhobo ezisekwe kwi-silicon, i-substrate eyi-12-intshi ijongana ngokufanelekileyo nokusasazeka kobushushu kwizixhobo ezinamandla aphezulu, yandisa ubomi bezixhobo.
Izicelo eziphambili
1. Iimoto zoMbane: I-substrate ye-SiC eyi-intshi ezili-12 (i-substrate ye-silicon carbide eyi-intshi ezili-12) yinxalenye ephambili yeenkqubo zokuqhuba umbane zesizukulwana esilandelayo, ezivumela ii-inverters ezisebenzayo kakhulu eziphucula ububanzi kunye nexesha lokutshaja.
2. Izitishi zeSiseko ze-5G: Izitishi zeSiC ezinkulu zixhasa izixhobo zeRF ezisebenza rhoqo, zihlangabezana neemfuno zezitishi zeSiseko ze-5G zamandla aphezulu kunye nokulahleka okuphantsi.
3. Izixhobo zoMbane zeMveliso: Kwii-solar inverters kunye nee-smart grids, i-substrate eyi-12-intshi inokumelana nee-voltage eziphezulu ngelixa inciphisa ukulahleka kwamandla.
4. Ii-elektroniki zabathengi: Iitshaja ezikhawulezayo zexesha elizayo kunye nezixhobo zamandla eziko ledatha zinokusebenzisa ii-substrates ze-SiC eziyi-12-intshi ukuze zifikelele kubukhulu obuncinci kunye nokusebenza kakuhle okuphezulu.
Iinkonzo ze-XKH
Siziingcali kwiinkonzo zokucubungula ezenzelwe wena ze-12-intshi SiC substrates (12-intshi silicon carbide substrates), kuquka:
1. Ukusika kunye nokupolisha: Ukulungiswa kwe-substrate okonakala kancinci, okuthe tyaba kakhulu okwenzelwe iimfuno zabathengi, ukuqinisekisa ukusebenza okuzinzileyo kwesixhobo.
2. Inkxaso yoKhulo lwe-Epitaxial: Iinkonzo ze-epitaxial wafer ezikumgangatho ophezulu zokukhawulezisa ukwenziwa kweetships.
3. I-Small-Batch Prototyping: Ixhasa ukuqinisekiswa kwe-R&D kumaziko ophando kunye namashishini, inciphisa imijikelo yophuhliso.
4. Ukubonisana ngoBugcisa: Izisombululo eziqala ekupheleni ukuya ekupheleni ukusuka ekukhetheni izinto ukuya ekuphuculeni inkqubo, ukunceda abathengi ukuba boyise imingeni yokucubungula iSiC.
Nokuba zezemveliso enkulu okanye ezenziwe ngokwezifiso ezikhethekileyo, iinkonzo zethu ze-substrate ze-SiC ze-12-intshi zihambelana neemfuno zakho zeprojekthi, zinika amandla ukuqhubela phambili kwetekhnoloji.









